STUDY OF THE EMISSIVE CHARACTERISTICS OF OBJECT SURFACES IN THE PRESENCE OF BACKGROUND RADIATION
DOI:
https://doi.org/10.31891/2219-9365-2026-85-12Keywords:
metrology, infrared temperature measurements, non-contact method, emissivity coefficient, infrared thermometer, infrared radiation pyrometer, ambient emission of objectsAbstract
This paper investigates the emissive properties of object surfaces under conditions of background radiation. A preliminary review of scientific sources is carried out, the main sources of background radiation are identified, and experimental studies are performed and described under various environmental conditions to assess the influence of background radiation on infrared temperature measurements.
The aim of the study is to evaluate the significance of the influence of background radiation on temperature measurements based on infrared radiation.
To achieve this objective, a series of experimental investigations was conducted using a UNI-T UTi260B thermal imager, with analysis of the thermal images obtained from the camera sensor as well as corresponding digital images. During the study, particular emphasis was placed on analyzing the effect of background radiation. Experimental measurements were performed under different external conditions in order to determine how the influence of background radiation varies depending on the surrounding environment. The study also examines how changes in the measurement environment can alter the intensity of background radiation during infrared temperature measurements and, consequently, affect the measured temperature values.
The obtained results can be used to analyze the influence of background radiation in infrared temperature measurements, to account for environmental conditions during measurements, and to apply appropriate corrections to the measurement results.
The practical significance of the obtained data lies in the possibility of implementing new solutions for energy saving, improving the safety of facilities, and enhancing technological processes related to infrared temperature measurement.
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Copyright (c) 2026 Олексій МОЧУРАД, Наталія ГОЦ

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