MODELING OF THE SYSTEM OF AUTOMATED QUALITY CONTROL OF POLYMER FILM PRODUCTION

Abstract

It is well known that, for example, in the United States, at least a hundred film thickness control systems (TCS) are installed in the production process every year. An increasing number of manufacturers supplying both measuring sensors and specialized integrated thickness correction (TC) systems are appearing on the market. Such systems can be either a part of the technological process (TP) or just laboratory equipment. In this qualification paper, we will mainly consider TC systems that operate on-line, i.e. in real time.
The intensification of modern product manufacturing requires the development of high-performance methods and the necessary means of quality control of finished products. Transverse dimensions (width, diameter, or thickness) are among the most important parameters for most products. They often affect the overall quality, reliability or even durability of other, more complex products, which is why they have rather tight manufacturing tolerances. In addition to a sufficiently high inspection accuracy, it is usually necessary to ensure that the product under inspection is subjected to relatively low impact. Existing contact transverse dimensional gauges not only have relatively low sensitivity, but also do not meet the requirements of modern production, as they have rather low productivity and do not allow for continuous automatic control. Therefore, the task of creating high-precision, high-speed, and relatively cheap transverse dimension gauges before the development of the capacitive method was not sufficiently effective.
In this work, we have developed a structural diagram of a capacitive measuring device and, on its basis, developed an electrical circuit diagram of a capacitance meter.