CONTROL OF THE SURFACE DENSITY OF MATERIALS WITH DIFFERENT STRUCTURES WITH AN AMPLITUDE-PHASE DEVICE

Authors

DOI:

https://doi.org/10.31891/2219-9365-2023-75-32

Keywords:

ultrasonic method, amplitude-phase device, surface density, wave amplitude, wave phase shift, non-contact control

Abstract

The non-contact ultrasonic method of surface density control will make it possible to conduct operational monitoring of the quality of materials with different structures during their production. The implementation of the ultrasonic non-contact method will allow to obtain materials with a surface density that will be within certain regulated limits, and will also provide an opportunity to reduce the consumption of raw materials in the production process. The specified non-contact method can be used for continuous measurements of the material parameter at each of its points, which is very difficult to implement using traditional contact destructive methods and means of control. Ensuring the surface density of various materials within acceptable limits may depend on many factors, but mainly it is influenced by measuring devices that work in accordance with various methods of converting measurement information. Contact methods and means of control of various technological parameters of materials are mainly used, but there may also be cases of non-contact methods and means of control in experimental systems in production.

The paper considers the possibility of using the ultrasonic method and the amplitude-phase control device of one of the main technological parameters, which is the surface density. The specified method and device can be used for materials with different structures that may have pores. The use of such a non-contact device to control the surface density of various materials will allow to quickly determine the technological parameter in the production process.

Published

2023-09-29

How to Cite

BARYLKO С., VOLKOVYI П., & DASHCHENKO В. (2023). CONTROL OF THE SURFACE DENSITY OF MATERIALS WITH DIFFERENT STRUCTURES WITH AN AMPLITUDE-PHASE DEVICE. MEASURING AND COMPUTING DEVICES IN TECHNOLOGICAL PROCESSES, (3), 261–268. https://doi.org/10.31891/2219-9365-2023-75-32