ASSESSMENT OF THE RELIABILITY OF ELECTRONIC PRODUCTS BY THE LEVEL OF LOW-FREQUENCY NOISE

Abstract

The article carries out a study of expanding the possibilities of monitoring electronic equipment products by the level of low-frequency noises for the evaluation of quantitative parameters of reliability. This allows electronics manufacturers to determine the appropriate limits of permissible noise levels, based on which it is possible to ensure the appropriate level of reliability and stable operation of devices based on electronic products.

To determine the reliability parameters, the non-stationary process of degradation of the internal structure of electronic equipment products was investigated based on an informative parameter and a random error. It was found that such a process is similar to a linear law and is characterized by mathematical expectation and dispersion. A generalized analytical expression for the random process of the reliability function of electronic products is obtained, which relates the root mean square value of the noise voltage, serviceability limits, and the failure interval. The parameters of the reliability function can be calculated on the basis of statistical processing of the results of experimental studies.

It was established that the level of intrinsic noise increases over time according to a law close to linear, and the random process of changing the informative parameter over time is close to the linear regression model. This also applies to the degradation of the internal structure. In addition, studies of the random process have shown that it has a linear dependence on the change of the informative parameter over time, and can be calculated on the basis of statistical processing of the results of experimental studies.