MYKHALEVSKIY Д.; STALCHENKO О. . ASSESSMENT OF THE RELIABILITY OF ELECTRONIC PRODUCTS BY THE LEVEL OF LOW-FREQUENCY NOISE. MEASURING AND COMPUTING DEVICES IN TECHNOLOGICAL PROCESSES, [S. l.], n. 2, p. 100–104, 2023. DOI: 10.31891/2219-9365-2023-74-13. Disponível em: https://vottp.khmnu.edu.ua/index.php/vottp/article/view/116. Acesso em: 20 may. 2024.